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Near-field optical imaging using force detection with new tip-electrode geometry
Near-field optical imaging using force detection with new tip-electrode geometry
Near-field optical imaging using force detection with new tip-electrode geometry
Abe, M. (Autor:in) / Sugawara, Y. (Autor:in) / Sawada, K. (Autor:in) / Andoh, Y. (Autor:in) / Morita, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 140 ; 383-387
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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