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Kelvin probe force microscopy using near-field optical tips
Kelvin probe force microscopy using near-field optical tips
Kelvin probe force microscopy using near-field optical tips
Shikler, R. (Autor:in) / Rosenwaks, Y. (Autor:in)
APPLIED SURFACE SCIENCE ; 157 ; 256-262
01.01.2000
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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