Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
Jiang, H. G. (Autor:in) / Ruehle, M. (Autor:in) / Lavernia, E. J. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 549-559
01.01.1999
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 1997
|British Library Online Contents | 2002
|Microstrain Analysis of Titanium Aluminides
British Library Online Contents | 2010
|Microstrain and growth fault structures in electrodeposited nanocrystalline Ni and Ni–Fe alloys
British Library Online Contents | 2013
|