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On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials
Jiang, H. G. (author) / Ruehle, M. (author) / Lavernia, E. J. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 549-559
1999-01-01
11 pages
Article (Journal)
English
DDC:
620.11
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