On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials: Fid-Bau Portal

On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

Jiang, H. G. / Ruehle, M. / Lavernia, E. J.

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On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

Jiang, H. G. / Ruehle, M. / Lavernia, E. J.

On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

Jiang, H. G. / Ruehle, M. / Lavernia, E. J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

Contributors:

Jiang, H. G. (author) / Ruehle, M. (author) / Lavernia, E. J. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 549-559

Publication date:

1999-01-01

Size:

11 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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