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Spectroscopic ellipsometry studies of heteroepitaxially grown cubic silicon carbide layers on silicon
Spectroscopic ellipsometry studies of heteroepitaxially grown cubic silicon carbide layers on silicon
Spectroscopic ellipsometry studies of heteroepitaxially grown cubic silicon carbide layers on silicon
Scheiner, J. (Autor:in) / Goldhahn, R. (Autor:in) / Cimalla, V. (Autor:in) / Ecke, G. (Autor:in) / Attenberger, W. (Autor:in) / Lindner, J.K.M. (Autor:in) / Gobsch, G. (Autor:in) / Pezoldt, J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 61-62 ; 526 - 530
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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