Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
EXAFS Study of Defect Clusters of Highly Er^3^+ Doped CaF~2 Thin Films
EXAFS Study of Defect Clusters of Highly Er^3^+ Doped CaF~2 Thin Films
EXAFS Study of Defect Clusters of Highly Er^3^+ Doped CaF~2 Thin Films
Cesaire, T. (Autor:in) / Hirsch, L. (Autor:in) / Porte, B. (Autor:in) / Barriere, A. S. (Autor:in)
MATERIALS SCIENCE FORUM ; 315/317 ; 394-399
01.01.1999
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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