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EXAFS Study of Defect Clusters of Highly Er^3^+ Doped CaF~2 Thin Films
EXAFS Study of Defect Clusters of Highly Er^3^+ Doped CaF~2 Thin Films
EXAFS Study of Defect Clusters of Highly Er^3^+ Doped CaF~2 Thin Films
Cesaire, T. (author) / Hirsch, L. (author) / Porte, B. (author) / Barriere, A. S. (author)
MATERIALS SCIENCE FORUM ; 315/317 ; 394-399
1999-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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