Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Cross-section TEM and optical characterization of porous silicon multilayer stacks
Cross-section TEM and optical characterization of porous silicon multilayer stacks
Cross-section TEM and optical characterization of porous silicon multilayer stacks
Martin-Palma, R. J. (Autor:in) / Herrero, P. (Autor:in) / Guerrero-Lemus, R. (Autor:in) / Moreno, J. D. (Autor:in) / Martinez-Duart, J. M. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 17 ; 845-848
01.01.1998
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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