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A platform for research: civil engineering, architecture and urbanism
Cross-section TEM and optical characterization of porous silicon multilayer stacks
Cross-section TEM and optical characterization of porous silicon multilayer stacks
Cross-section TEM and optical characterization of porous silicon multilayer stacks
Martin-Palma, R. J. (author) / Herrero, P. (author) / Guerrero-Lemus, R. (author) / Moreno, J. D. (author) / Martinez-Duart, J. M. (author)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 17 ; 845-848
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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