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X-ray characterization of germanium nanoclusters in silica thin films
X-ray characterization of germanium nanoclusters in silica thin films
X-ray characterization of germanium nanoclusters in silica thin films
Schiestel, S. (Autor:in) / Qadri, S.B. (Autor:in) / Carosella, C.A. (Autor:in) / Stroud, R.M. (Autor:in) / Knies, D.L. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 69-70 ; 397 - 400
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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