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The Strained Lattice of Porous Si Studied by Grazing Incidence X-Ray Diffraction
The Strained Lattice of Porous Si Studied by Grazing Incidence X-Ray Diffraction
The Strained Lattice of Porous Si Studied by Grazing Incidence X-Ray Diffraction
Zsoldos, L. (Autor:in)
MATERIALS SCIENCE FORUM ; 321-324 ; 610-615
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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