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The Strained Lattice of Porous Si Studied by Grazing Incidence X-Ray Diffraction
The Strained Lattice of Porous Si Studied by Grazing Incidence X-Ray Diffraction
The Strained Lattice of Porous Si Studied by Grazing Incidence X-Ray Diffraction
Zsoldos, L. (author)
MATERIALS SCIENCE FORUM ; 321-324 ; 610-615
2000-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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