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Characterization of the surfaces of hydrogen-passivated silicon by STM
Characterization of the surfaces of hydrogen-passivated silicon by STM
Characterization of the surfaces of hydrogen-passivated silicon by STM
Herion, J. (Autor:in) / Ross, C. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 244 - 248
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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