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Characterization of the surfaces of hydrogen-passivated silicon by STM

Herion, J. / Ross, C.

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Characterization of the surfaces of hydrogen-passivated silicon by STM

Herion, J. / Ross, C.

Characterization of the surfaces of hydrogen-passivated silicon by STM

Herion, J. / Ross, C.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization of the surfaces of hydrogen-passivated silicon by STM

Contributors:

Herion, J. (author) / Ross, C. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 244 - 248

Publication date:

2000-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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