Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
Dharmadhikari, C. V. (Autor:in) / Ali, A. O. (Autor:in) / Suresh, N. (Autor:in) / Phase, D. M. (Autor:in) / Chaudhari, S. M. (Autor:in) / Gupta, A. (Autor:in) / Dasannacharya, B. A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 75 ; 29 - 37
01.01.2000
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Atomic Force Microscopy/Scanning Tunneling Microscopy
| TIBKAT | 1994
Atomic Force Microscopy/Scanning Tunneling Microscopy 2
| TIBKAT | 1997
| British Library Online Contents | 1997