A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
A comparison of nucleation and growth investigations of thin films using scanning tunneling microscopy, atomic force microscopy and X-ray scattering
Dharmadhikari, C. V. (author) / Ali, A. O. (author) / Suresh, N. (author) / Phase, D. M. (author) / Chaudhari, S. M. (author) / Gupta, A. (author) / Dasannacharya, B. A. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 75 ; 29 - 37
2000-01-01
9 pages
Article (Journal)
English
DDC:
620.11
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Atomic Force Microscopy/Scanning Tunneling Microscopy
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