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Recovery stress generation in shape memory Ti50Ni45Cu5 thin wires
Recovery stress generation in shape memory Ti50Ni45Cu5 thin wires
Recovery stress generation in shape memory Ti50Ni45Cu5 thin wires
Sittner, P. (Autor:in) / Vokoun, D. (Autor:in) / Dayananda, G. N. (Autor:in) / Stalmans, R. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 286 ; 298 - 311
01.01.2000
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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