Investigation of Fermi-level pinning at silicon/porous-silicon interface by vibrating capacitor and surface photovoltage measurements

Mizsei, J. / Shrair, J. A. / Zolomy, I. | British Library Online Contents | 2004

Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon

Castaldini, A. / Cavalcoli, D. / Cavallini, A. et al. | British Library Online Contents | 2002

Surface photovoltage in silicon. Novel applications for chemical and biological sensing

Nauka, K. / Li, Z. / Kamins, T. I. | British Library Online Contents | 2005

Evaluations of the intrinsic stress value in silicon wafers from photovoltage measurements

Patrin, A. | British Library Online Contents | 2000

Influence of experimental parameters on physical properties of porous silicon and oxidized porous silicon layers

Charrier, J. / Alaiwan, V. / Pirasteh, P. et al. | British Library Online Contents | 2007