Surface photovoltage measurements for Cu, Ti and W determination in Si wafers

Cali, D. / Camalleri, C. M. / Raineri, V. | British Library Online Contents | 2001

Non-Contact Photovoltage Measurements in SiC

Koshka, Y. / Mazzola, M. S. | British Library Online Contents | 2000

The engineering of intrinsic point defects in silicon wafers and crystals

Falster, R. / Voronkov, V. V. | British Library Online Contents | 2000

Investigation of Fermi-level pinning at silicon/porous-silicon interface by vibrating capacitor and surface photovoltage measurements

Mizsei, J. / Shrair, J. A. / Zolomy, I. | British Library Online Contents | 2004

Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon

Castaldini, A. / Cavalcoli, D. / Cavallini, A. et al. | British Library Online Contents | 2002