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Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern
Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern
Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern
Pailloux, F. (Autor:in) / Gaboriaud, R. J. (Autor:in) / Champeaux, C. (Autor:in) / Catherinot, A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 244 - 247
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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