Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern: Fid-Bau Portal

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Pailloux, F. / Gaboriaud, R. J. / Champeaux, C. / Catherinot, A.

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Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Pailloux, F. / Gaboriaud, R. J. / Champeaux, C. / Catherinot, A.

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Pailloux, F. / Gaboriaud, R. J. / Champeaux, C. / Catherinot, A.

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Check availability in my library

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Document information

Title:

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Contributors:

Pailloux, F. (author) / Gaboriaud, R. J. (author) / Champeaux, C. (author) / Catherinot, A. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 244 - 247

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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