Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications: Fid-Bau Portal

Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Milani, A. / Pietralunga, S. M. / Sangiovanni, A. / Zappettini, A. / Martinelli, M.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Milani, A. / Pietralunga, S. M. / Sangiovanni, A. / Zappettini, A. / Martinelli, M.

Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Milani, A. / Pietralunga, S. M. / Sangiovanni, A. / Zappettini, A. / Martinelli, M.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Beteiligte:

Milani, A. (Autor:in) / Pietralunga, S. M. (Autor:in) / Sangiovanni, A. (Autor:in) / Zappettini, A. (Autor:in) / Martinelli, M. (Autor:in)

Erschienen in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 205 - 208

Erscheinungsdatum:

01.01.2000

Format / Umfang:

4 pages

ISSN:

0921-5093

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Chaussende, D. / Mercier, F. / Madar, R. et al. | British Library Online Contents | 2009

Residual Stress Measurement in Ion-Exchanged Glass by Iterated Birefringence and Etching-

Abrams, M. / Shen, J. / Green, D. | British Library Online Contents | 2004

Analysis of Stress-Induced Birefringence in Nd:YAG Crystal

Matsuura, H. / Kunieda, Y. / Yoshihara, N. et al. | British Library Online Contents | 2007

Fatigue and residual stress relaxation of deep rolled differently aged aluminium alloy AA6110

Juijerm, P. / Altenberger, I. / Scholtes, B. | British Library Online Contents | 2006

Residual Stress Mapping in Railway Rails

Kelleher, J. F. / Buttle, D. J. / Mummery, P. M. et al. | British Library Online Contents | 2005

Nach oben