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Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Milani, A. / Pietralunga, S. M. / Sangiovanni, A. / Zappettini, A. / Martinelli, M.

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Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Milani, A. / Pietralunga, S. M. / Sangiovanni, A. / Zappettini, A. / Martinelli, M.

Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Milani, A. / Pietralunga, S. M. / Sangiovanni, A. / Zappettini, A. / Martinelli, M.

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Access via TIB

Check availability in my library

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Document information

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Document information

Title:

Two-dimensional mapping of residual stress-induced birefringence in differently-grown semiconductors for optical communication applications

Contributors:

Milani, A. (author) / Pietralunga, S. M. (author) / Sangiovanni, A. (author) / Zappettini, A. (author) / Martinelli, M. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 288 ; 205 - 208

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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