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The engineering of intrinsic point defects in silicon wafers and crystals
The engineering of intrinsic point defects in silicon wafers and crystals
The engineering of intrinsic point defects in silicon wafers and crystals
Falster, R. (Autor:in) / Voronkov, V. V. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 73 ; 87 - 94
01.01.2000
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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