Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Atomic force profilometry and long scan atomic force microscopy: new techniques for characterisation of surfaces
Atomic force profilometry and long scan atomic force microscopy: new techniques for characterisation of surfaces
Atomic force profilometry and long scan atomic force microscopy: new techniques for characterisation of surfaces
Cunningham, T. (Autor:in) / Serry, F. M. (Autor:in) / Ge, L. M. (Autor:in) / Gotthard, D. (Autor:in) / Dawson, D. J. (Autor:in)
SURFACE ENGINEERING -LONDON- ; 16 ; 295-298
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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