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Atomic force profilometry and long scan atomic force microscopy: new techniques for characterisation of surfaces
Atomic force profilometry and long scan atomic force microscopy: new techniques for characterisation of surfaces
Atomic force profilometry and long scan atomic force microscopy: new techniques for characterisation of surfaces
Cunningham, T. (author) / Serry, F. M. (author) / Ge, L. M. (author) / Gotthard, D. (author) / Dawson, D. J. (author)
SURFACE ENGINEERING -LONDON- ; 16 ; 295-298
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.44
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