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X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification
X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification
X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification
Ritley, K. A. (Autor:in) / Just, K.-P. (Autor:in) / Schreiber, F. (Autor:in) / Dosch, H. (Autor:in) / Niesen, T. P. (Autor:in) / Aldinger, F. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 2706-2713
01.01.2000
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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