X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification: Fid-Bau Portal

X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification

Ritley, K. A. / Just, K.-P. / Schreiber, F. / Dosch, H. / Niesen, T. P. / Aldinger, F.

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X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification

Ritley, K. A. / Just, K.-P. / Schreiber, F. / Dosch, H. / Niesen, T. P. / Aldinger, F.

X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification

Ritley, K. A. / Just, K.-P. / Schreiber, F. / Dosch, H. / Niesen, T. P. / Aldinger, F.

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Title:

X-ray reflectivity study of solution-deposited ZrO~2 thin films on self-assembled monolayers: Growth, interface properties, and thermal densification

Contributors:

Ritley, K. A. (author) / Just, K.-P. (author) / Schreiber, F. (author) / Dosch, H. (author) / Niesen, T. P. (author) / Aldinger, F. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 2706-2713

Publication date:

2000-01-01

Size:

8 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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