Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance
Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance
Radiation-Induced Pair Defects in 6H-SiC Studied by Optically Detected Magnetic Resonance
Lingner, T. (Autor:in) / Greulich-Weber, S. (Autor:in) / Spaeth, J.-M. (Autor:in)
MATERIALS SCIENCE FORUM ; 353/356 ; 505-508
01.01.2001
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
| British Library Online Contents | 1997
C-Face Interface Defects in 4H-SiC MOSFETs Studied by Electrically Detected Magnetic Resonance
| British Library Online Contents | 2014
Electrically and Optically Detected Magnetic Resonance in GaN-Based Leds
| British Library Online Contents | 1997
Hole and Electron Effective Masses in 6H-SiC Studied by Optically Detected Cyclotron Resonance
| British Library Online Contents | 2002
Optically Detected Cyclotron Resonance for Defect Characterization
| British Library Online Contents | 1993