Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces
Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces
Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces
Stapel, D. (Autor:in) / Benninghoven, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 174 ; 261-270
01.01.2001
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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