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Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

Stapel, D. / Benninghoven, A.

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Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

Stapel, D. / Benninghoven, A.

Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

Stapel, D. / Benninghoven, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

Contributors:

Stapel, D. (author) / Benninghoven, A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 174 ; 261-270

Publication date:

2001-01-01

Size:

10 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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