Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth: Fid-Bau Portal

Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth

Fabreguette, F. / Imhoff, L. / Heintz, O. / Maglione, M. / Domenichini, B. / Marco de Lucas, M. C. / Sibillot, P. / Bourgeois, S. / Sacilotti, M.

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Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth

Fabreguette, F. / Imhoff, L. / Heintz, O. / Maglione, M. / Domenichini, B. / Marco de Lucas, M. C. / Sibillot, P. / Bourgeois, S. / Sacilotti, M.

Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth

Fabreguette, F. / Imhoff, L. / Heintz, O. / Maglione, M. / Domenichini, B. / Marco de Lucas, M. C. / Sibillot, P. / Bourgeois, S. / Sacilotti, M.

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Bestellung bei Subito €

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Titel:

Structural and in depth characterization of newly designed conducting/insulating TiNxOy/TiO2 multilayers obtained by one step LP-MOCVD growth

Beteiligte:

Fabreguette, F. (Autor:in) / Imhoff, L. (Autor:in) / Heintz, O. (Autor:in) / Maglione, M. (Autor:in) / Domenichini, B. (Autor:in) / Marco de Lucas, M. C. (Autor:in) / Sibillot, P. (Autor:in) / Bourgeois, S. (Autor:in) / Sacilotti, M. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 175-176 ; 685-690

Erscheinungsdatum:

01.01.2001

Format / Umfang:

6 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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