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Electronic structures of TPD/metal interfaces studied by photoemission and Kelvin probe method

Ito, E. / Oji, H. / Hayashi, N. / Ishii, H. / Ouchi, Y. / Seki, K.

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Electronic structures of TPD/metal interfaces studied by photoemission and Kelvin probe method

Ito, E. / Oji, H. / Hayashi, N. / Ishii, H. / Ouchi, Y. / Seki, K.

Electronic structures of TPD/metal interfaces studied by photoemission and Kelvin probe method

Ito, E. / Oji, H. / Hayashi, N. / Ishii, H. / Ouchi, Y. / Seki, K.

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Titel:

Electronic structures of TPD/metal interfaces studied by photoemission and Kelvin probe method

Beteiligte:

Ito, E. (Autor:in) / Oji, H. (Autor:in) / Hayashi, N. (Autor:in) / Ishii, H. (Autor:in) / Ouchi, Y. (Autor:in) / Seki, K. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 175-176 ; 407-411

Erscheinungsdatum:

01.01.2001

Format / Umfang:

5 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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