Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy
Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy
Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy
Palermo, V. (Autor:in) / Palma, M. (Autor:in) / Samori, P. (Autor:in)
ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 18 ; 145-164
01.01.2006
20 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Kelvin Probe Force Microscopy of Molecular Surfaces
| British Library Online Contents | 1999
Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy
| British Library Online Contents | 2013
Kelvin probe force microscopy using near-field optical tips
| British Library Online Contents | 2000
| British Library Online Contents | 2011
Study of asymmetric charge writing on Pb(Zr,Ti)O3 thin films by Kelvin probe force microscopy
| British Library Online Contents | 2006