Atomic force microscopy, lateral force microscopy, and transmission electron microscopy investigations and adhesion force measurements for elucidation of tungsten removal mechanisms

Stein, D. J. / Cecchi, J. L. / Hetherington, D. L. | British Library Online Contents | 1999

Surface structure of poly(3-alkylthiophene) films studied by atomic force microscopy

Relini, A. / Bolognesi, A. / Botta, C. et al. | British Library Online Contents | 2002

Morphology study of rubber based nanocomposites by transmission electron microscopy and atomic force microscopy

Sadhu, S. / Bhowmick, A. K. | British Library Online Contents | 2005

C-Ni amorphous multilayers studied by atomic force microscopy

Ulmeanu, M. / Serghei, A. / Mihailescu, I. N. et al. | British Library Online Contents | 2000

Atomic Force Microscopy

Blanchard, C. R. / Campbell, J. B. | British Library Online Contents | 1995