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Phase separation in SiO~2-TiO~2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy
Phase separation in SiO~2-TiO~2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy
Phase separation in SiO~2-TiO~2 gel and glassy films studied by atomic force microscopy and transmission electron microscopy
Karthikeyan, A. (author) / Almeida, R. M. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 16 ; 1626-1631
2001-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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