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Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

Song, S.-H. / Xiao, P.

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Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

Song, S.-H. / Xiao, P.

Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

Song, S.-H. / Xiao, P.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

Beteiligte:

Song, S.-H. (Autor:in) / Xiao, P. (Autor:in)

Erschienen in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 20 ; 1051-1054

Erscheinungsdatum:

01.01.2001

Format / Umfang:

4 pages

ISSN:

0261-8028

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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The Effective Thermal Expansion of Nickel and Nickel Oxide During High-Temperature Oxidation

Wolf, J. S. / Cavin, O. B. | British Library Online Contents | 1994

Microstructural investigation of the oxide formed on TP 347H FG during long-term steam oxidation

Hansson, A. N. / Danielsen, H. / Grumsen, F. B. et al. | British Library Online Contents | 2010

An impedance spectroscopy study of oxide films formed during high temperature oxidation of an austenitic stainless steel

Song, S. H. / Xiao, P. | British Library Online Contents | 2003

The re-oxidation of pre-formed nickel oxide scales

Harris, A. W. / Brown, J. S. / Atkinson, A. | British Library Online Contents | 1993

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