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    Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

    New search for: Song, S.-H.
    New search for: Xiao, P.

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    Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

    New search for: Song, S.-H.
    New search for: Xiao, P.

    Access

    Access via TIB
    Check availability in my library
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    Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

    New search for: Song, S.-H.
    New search for: Xiao, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

    Contributors:

    Song, S.-H. (author) / Xiao, P. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE LETTERS ; 20 ; 1051-1054

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    0261-8028

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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