Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction
Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction
Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction
Delgado, G. (Autor:in) / Mora, A. J. (Autor:in) / Pineda, C. (Autor:in) / Tinoco, T. (Autor:in)
MATERIALS RESEARCH BULLETIN ; 36 ; 2507-2517
01.01.2001
11 pages
Aufsatz (Zeitschrift)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Rietveld refinement of the semiconducting system Bi2-xFexTe3 from X-ray powder diffraction
British Library Online Contents | 2007
|Rietveld Refinement of the Crystal Structure of Silver-Oxalate from Neutron Powder Diffraction Data
British Library Online Contents | 1996
|Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
British Library Online Contents | 1993
|Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
British Library Online Contents | 1993
|Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
British Library Online Contents | 2006
|