A platform for research: civil engineering, architecture and urbanism
Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction
Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction
Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction
Delgado, G. (author) / Mora, A. J. (author) / Pineda, C. (author) / Tinoco, T. (author)
MATERIALS RESEARCH BULLETIN ; 36 ; 2507-2517
2001-01-01
11 pages
Article (Journal)
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Rietveld refinement of the semiconducting system Bi2-xFexTe3 from X-ray powder diffraction
British Library Online Contents | 2007
|Rietveld Refinement of the Crystal Structure of Silver-Oxalate from Neutron Powder Diffraction Data
British Library Online Contents | 1996
|Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
British Library Online Contents | 1993
|Rietveld refinement employing X-ray data on CaWO~4 from different powder diffraction geometries
British Library Online Contents | 1993
|Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
British Library Online Contents | 2006
|