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Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures
Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures
Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures
Srnanek, R. (Autor:in) / Gurnik, P. (Autor:in) / Harmatha, L. (Autor:in) / Gregora, I. (Autor:in)
APPLIED SURFACE SCIENCE ; 183 ; 86-92
01.01.2001
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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