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Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures

Srnanek, R. / Gurnik, P. / Harmatha, L. / Gregora, I.

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Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures

Srnanek, R. / Gurnik, P. / Harmatha, L. / Gregora, I.

Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures

Srnanek, R. / Gurnik, P. / Harmatha, L. / Gregora, I.

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Check availability in my library

Order at Subito €

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Document information

Title:

Diagnostics of Si multi-d-doped GaAs layers by Raman spectroscopy on bevelled structures

Contributors:

Srnanek, R. (author) / Gurnik, P. (author) / Harmatha, L. (author) / Gregora, I. (author)

Published in:

APPLIED SURFACE SCIENCE ; 183 ; 86-92

Publication date:

2001-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Srnanek, R. / Geurts, J. / Lentze, M. et al. | British Library Online Contents | 2004

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Srnanek, R. / Kinder, R. / Sciana, B. et al. | British Library Online Contents | 2001

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Srnanek, R. / Irmer, G. / Geurts, J. et al. | British Library Online Contents | 2005

A Raman study of GaAsN, GaInAsN layers on bevelled samples

Srnanek, R. / Vincze, A. / Kovac, J. et al. | British Library Online Contents | 2002

Supersonic Jets from Bevelled Rectangular Nozzles

Rice, E. J. / Raman, G. / ASME | British Library Conference Proceedings | 1993