The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures

Stuer, C. / Van Landuyt, J. / Bender, H. et al. | British Library Online Contents | 2001

Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon

Gambetta, F. / Frabboni, S. / Tonini, R. et al. | British Library Online Contents | 2000

Electron backscattered diffraction microtexture studies on hot deformed aluminum crystals

Driver, J. H. / Theyssier, M.-C. / Maurice, C. | British Library Online Contents | 1996

X-ray diffraction analysis of internal stresses in the dislocation structure of cyclically deformed nickel single crystals

Hecker, M. / Thiele, E. / Holste, C. | British Library Online Contents | 1997

Microstructure Study of BaTiO~3 Ceramics Using Convergent Beam Electron Diffraction

Kobayashi, K. / Suzuki, T. / Mizuno, Y. | British Library Online Contents | 2009