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Tb L~3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications
Tb L~3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications
Tb L~3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications
Choi, Y. G. (Autor:in) / Sohn, K.-S. (Autor:in) / Kim, K. H. (Autor:in) / Park, H. D. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 31-35
01.01.2002
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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