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Tb L~3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications
Tb L~3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications
Tb L~3-edge x-ray absorption near-edge structure spectroscopic analysis of terbium-doped phosphor compounds for plasma display panel applications
Choi, Y. G. (author) / Sohn, K.-S. (author) / Kim, K. H. (author) / Park, H. D. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 31-35
2002-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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