Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Delamination of Thin Films From Two-Dimensional Interface Flaws at Corners and Edges
Delamination of Thin Films From Two-Dimensional Interface Flaws at Corners and Edges
Delamination of Thin Films From Two-Dimensional Interface Flaws at Corners and Edges
Begley, M. R. (Autor:in) / Ambrico, J. M. (Autor:in)
INTERNATIONAL JOURNAL OF FRACTURE ; 112 ; 205-222
01.01.2001
18 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1126
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