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The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges
The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges
The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges
Ambrico, J. M. (Autor:in) / Begley, M. R. (Autor:in)
ENGINEERING FRACTURE MECHANICS ; 70 ; 1721-1736
01.01.2003
16 pages
Aufsatz (Zeitschrift)
Englisch
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Delamination of Thin Films From Two-Dimensional Interface Flaws at Corners and Edges
British Library Online Contents | 2001
|IuD Bahn | 2013
|British Library Online Contents | 2001
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