Contactless Characterization of Semiconductors Using Laser-Induced Surface Photo-Charge Voltage Measurements

Abbate, A. / Rencibia, P. / Ivanov, O. et al. | British Library Online Contents | 1995

Contactless electromodulation for in-situ characterization of semiconductor processing

Yin, X. / Guo, X. / Pollak, F. H. et al. | British Library Online Contents | 1993

Contactless electrical characterization of surface and interface of SOI materials

Nakamura, S. / Watanabe, D. / En, A. et al. | British Library Online Contents | 2003

Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III-V semiconductor device structures

Pollak, F. H. | British Library Online Contents | 2001

Contactless Pneumatic Method for Surface Tension Measurements

Mordasov, M. M. / Galizdra, B. I. / Astakhov, V. P. | British Library Online Contents | 1994