Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III-V semiconductor device structures

Pollak, F. H. | British Library Online Contents | 2001

Contactless surface charge semiconductor characterization

Schroder, D. K. | British Library Online Contents | 2002

Ultra high vacuum-based in situ characterization of compound semiconductor surfaces by a contactless capacitance-voltage technique

Hasegawa, H. / Takahashi, H. / Yoshida, T. et al. | British Library Online Contents | 2001

Fast, high resolution, inline contactless electrical semiconductor characterization for photovoltaic applications by microwave detected photoconductivity

Dornich, K. / Schuler, N. / Berger, B. et al. | British Library Online Contents | 2013

A Small-Scale, Contactless, Pure Bending Device for In-situ Testing

Hoefnagels, J. P. / Ruybalid, A. P. / Buizer, C. A. | British Library Online Contents | 2015