Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
DLTS characterisation of InGaAlP films grown using different V/III ratios
DLTS characterisation of InGaAlP films grown using different V/III ratios
DLTS characterisation of InGaAlP films grown using different V/III ratios
Lim, H. F. (Autor:in) / Chi, D. Z. (Autor:in) / Dong, J. R. (Autor:in) / Soh, C. B. (Autor:in) / Chua, S. J. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 625-629
01.01.2001
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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